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Join Us Online: New Nanoindentation Seminars! |
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Written by Erick Martínez
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Thursday, 10 March 2011 14:34 |
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Agilent Technologies invites you to attend our brand new scientific e-Seminars.
These exclusive one-hour live events provide a great opportunity to learn about
some of the latest nanoindentation techniques and applications. There will also
be Q&A sessions in which all online attendees can query the presenters directly.
Register now for one or more of these informative seminars!
"Oliver & Pharr: The Strange New World"
Date: March 22 @ 10:00 a.m. (ET)
Topic: Exploring the Strange New World of Small-Scale Deformation
with Nanoindentation
Warren C. Oliver, Ph.D. (Nanomechanics, Inc.)
George M. Pharr, Ph.D. (University of Tennessee-Knoxville)
We will jointly present some of the unexpected results that have been observed using
nanoindentation. The characteristics of the data will be discussed along with our
understanding of the physical phenomena that cause the observed data.
This duo's landmark 1992 article in JMR ushered in the era of nanoindentation. According
to Thomas Reuters Web of Knowledge, it is one of the most cited articles in all
of material science (nearly 6,000 citations).
"Exclusive New Thin Film Method"
Date: April 5 @ 11:00 a.m. (ET)
Topic 1: Measuring Substrate-Independent Young's Modulus of Thin Films
Jennifer Hay (Agilent Technologies)
Substrate influence is a common problem when using instrumented indentation (also
known as nanoindentation) to evaluate the elastic moduli of thin films. In this
seminar, a new analytic model is presented for determining the elastic modulus of
the film alone when the sensed response is substantially influenced by the substrate.
This new model is an improvement over previous models of the same kind, because
it works well for both stiff films on compliant substrates and compliant films on
stiff substrates.
Topic 2: Charactering the Mechanical Properties of Nanoporous and Nanoparticle
Thin Films Gang Feng, Ph.D. (Villanova University)
Nanoporous and nanoparticle thin films with good mechanical properties are important
for energy conversion and storage, catalyst, and biomedical
applications. Nanoindentation technique has been widely used to characterize
the mechanical properties of thin films. However, for submicron-thick
nanoporous and nanoparticle thin films, the substrate effect can be significant,
as relatively large indentations are needed to minimize the inhomogeneity and
surface roughness effects. Several new thin-film-indentation-analysis
methods, such as the Hay method for modulus and the Han-Nix method for
hardness, are used to analyze the measurements for nanoporous and
nanoparticle thin films.
Join us for one or more of these exciting live events!
Register Agilent e-Seminars feature a user-friendly, web-based conferencing system that allows
you and your colleagues to take part in real-time, interactive presentations on
subjects that are pertinent to your work.
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Agilent Technologies, Inc. | 4330 W. Chandler Blvd | Chandler | AZ | 85226 |
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Last Updated on Thursday, 10 March 2011 14:38 |
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Atomic Force Microscopy Seminars on Line! |
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Written by Erick Martínez
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Thursday, 10 March 2011 14:31 |
Agilent Technologies invites you to attend our scientific e-Seminars. These exclusive
one-hour live events provide a great opportunity to learn about some of the latest
atomic force microscopy (AFM) techniques and applications. There will also be Q&A
sessions in which all online attendees can query the presenters directly.
Register []
now for one or more of these informative events!
"AFM Troubleshooting Basics"
Date: March 15 @ 10:00 a.m. (ET)
Topic: How to Troubleshoot an Atomic Force Microscope
Song Xu, Ph.D. (Agilent Technologies)
Most AFM-related problems do not involve hardware defects and can be diagnosed without
an engineering background. We will discuss several topics here, including: tip-related
problems, parameter-related problems, sample-mounting-related problems, connection
problems, noise-related problems, and drift sources and solutions. Feel free to
e-mail us additional AFM troubleshooting topics you would like to see addressed,
or your own AFM troubleshooting solutions.
"New Cantilevers for Basic & Advanced AFM"
Date: March 30 @ 10:00 a.m. (ET)
Topic 1: Back to the Basics: How to Choose the Right Cantilever
Song Xu, Ph.D. (Agilent Technologies)
We will discuss one of the key fundamental aspects of obtaining a good-resolution
AFM image of a sample, that is, how to choose the right cantilever for your application.
There are more than 10 cantilever manufacturing companies around the world, each
of which produces cantilevers made of different materials, with different coatings,
stiffnesses, resonance frequencies, and qualities. We will discuss how to understand
the parameters of a cantilever, which cantilever to choose, how to judge the quality
of the tip, and how to take advantage of uniquely designed cantilevers.
Topic 2: Advanced AFM Probes, Probes for Special Applications & New Tip
Developments
Oliver Krause, Ph.D. (NanoWorld Group)
Besides "everyday use" AFM probes, there is a large variety of brand new tips and
cantilevers now available for special applications. Many of these advanced AFM probes
will be presented in this seminar. An overview of tips and cantilevers for exceptional
or novel AFM applications (such as nanoindentation probes, cantilevers for imaging
at higher harmonics, and tips for high-speed AFM) will be given.
"A Double Feature for Film Buffs"
Date: April 7 @ 10:00 a.m. (ET)
Topic 1: High-Resolution Characterization of Organic Ultrathin Films Using
AFM
Jing-jiang Yu, Ph.D. (Agilent Technologies)
High-resolution characterization of organic ultrathin films and related materials
using AFM provides a better understanding of interfacial structures and local properties.
Various types of samples - including self-assembled monolayers (SAMs), polymers,
and few-layer graphene (FLG) - are investigated with the Agilent 5600LS AFM system.
Recent AFM examination results of high-throughput fabrication of SAM nanostructures
via nonconventional lithography methods will also be shown.
Topic 2: Atomic Force Acoustic Microscopy - One Tool, Multiple Applications
Malgorzata Kopycinska-Mueller, Ph.D. (IZFP-Dresden)
Atomic force acoustic microscopy (AFAM) employs resonance frequencies of an AFM
cantilever contacting a sample surface to determine elastic properties. This highly
sensitive, versatile tool works in imaging or spectroscopy mode, providing information
on the elastic properties of a sample with nanoscale spatial resolution. It can
be used to detect SAMs, ferroelectric domains, subsurface defects, and changes in
film-substrate adhesion, as well as to determine the elastic properties of films
with thicknesses in the nm range. Recent data acquired using an Agilent 5600LS
AFM system will be presented.
Join us for one or more of these exciting live events!
Register []
Agilent e-Seminars feature a user-friendly, web-based conferencing system that allows
you and your colleagues to take part in real-time, interactive presentations on
subjects that are pertinent to your work.
~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~~
Agilent Technologies, Inc. | 4330 W. Chandler Blvd | Chandler | AZ | 85226 |
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Last Updated on Thursday, 10 March 2011 14:38 |
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